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Электронный компонент: ADN2815

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Continuous Rate 12.3 Mb/s to 1.25 Gb/s Clock
and Data Recovery IC
Preliminary Technical Data
ADN2815
Rev. PrA
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703
2004 Analog Devices, Inc. All rights reserved.
FEATURES
Serial data input: 12.3 Mb/s to 1.25 Gb/s
Exceeds SONET requirements for jitter transfer/
generation/tolerance
Patented clock recovery architecture
No reference clock required
Loss of lock indicator
I
2
CTM interface to access optional features
Single-supply operation: 3.3 V
Low power: 300 mW typical
5 mm 5 mm 32-lead LFCSP
APPLICATIONS
SONET OC-1/3/12 and all associated FEC rates
Fibre Channel, GbE, HDTV, etc.
WDM transponders
Regenerators/repeaters
Test equipment
Broadband cross-connects and routers
PRODUCT DESCRIPTION
The ADN2815 provides the receiver functions of quantization
and clock and data recovery for continuous data rates from 12.3
Mb/s to 1.25 Gb/s. The ADN2815 automatically locks to all data
rates without the need for an external reference clock or
programming. All SONET jitter requirements are met,
including jitter transfer, jitter generation, and jitter tolerance.
All specifications are quoted for -40C to +85C ambient
temperature, unless otherwise noted.
The ADN2815 is available in a compact 5 mm 5 mm 32-lead
chip scale package.

FUNCTIONAL BLOCK DIAGRAM
2
04952-0-001
LOL
DATAOUTP/N
DRVEE DVCC
DRVCC
DVEE
CLKOUTP/N
2
VCC
VEE
CF1
CF2
PIN
NIN
VREF
BUFFER
VCO
PHASE
SHIFTER
PHASE
DETECT
FREQUENCY
DETECT
DATA
RE-TIMING
LOOP
FILTER
LOOP
FILTER
REFCLKP/N
(OPTIONAL)
Figure 1.

ADN2815
Preliminary Technical Data
Rev. PrA | Page 2 of 27
TABLE OF CONTENTS
Specifications..................................................................................... 3
Jitter Specifications....................................................................... 4
Output and Timing Specifications ............................................. 5
Absolute Maximum Ratings............................................................ 6
Thermal Characteristics .............................................................. 6
ESD Caution.................................................................................. 6
Timing Characteristics..................................................................... 7
Pin Configuration and Function Descriptions............................. 8
Typical Performance Characteristics ............................................. 9
I
2
C Interface Timing and Internal Register Description........... 10
Jitter Specifications ......................................................................... 12
Jitter Generation ......................................................................... 12
Jitter Transfer............................................................................... 12
Jitter Tolerance ............................................................................ 12
Theory of Operation ...................................................................... 13
Functional Description.................................................................. 15
Frequency Acquisition............................................................... 15
Input buffer ................................................................................. 15
Lock Detector Operation .......................................................... 15
Harmonic Detector .................................................................... 16
Squelch Mode ............................................................................. 16
I
2
C Interface ................................................................................ 16
Reference Clock (Optional) ...................................................... 17
Applications Information .............................................................. 20
PCB Design Guidelines ............................................................. 20
Coarse Data Rate Readback Look-Up Table............................... 23
Outline Dimensions ....................................................................... 25
Ordering Guide .......................................................................... 25
REVISION HISTORY
6/04--Revision PrA: Initial Version
Preliminary Technical Data
ADN2815
Rev. PrA | Page 3 of 27
SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, VCC = V
MIN
to V
MAX
, VEE = 0 V, C
F
= 0.47 F, SLICEP = SLICEN = VEE, Input Data Pattern: PRBS 2
23
- 1,
unless otherwise noted.
Table 1.
Parameter Conditions
Min
Typ
Max
Unit
QUANTIZER--DC
CHARACTERISTICS
Input Voltage Range
@ PIN or NIN, dc-coupled
1.8
2.8
V
Peak-to-Peak Differential Input
PIN NIN
0.2
2.0
V
Input Common Mode Level
DC-coupled
2.3
2.5
2.8
V
QUANTIZER--AC
CHARACTERISTICS
Data Rate
12.3
1250
Mb/s
S11
@ 2.5 GHz
-15
dB
Input Resistance
Differential
100
Input
Capacitance
0.65
pF
LOSS OF LOCK DETECT (LOL)
VCO Frequency Error for LOL Assert
With respect to nominal
1000
ppm
VCO Frequency Error for LOL De-Assert
With respect to nominal
250
ppm
LOL Response Time
12.3 Mb/s
4
ms
OC-12
1.0
s
GbE
1.0
s
ACQUISITION
TIME
Lock to Data Mode
1GbE
1.5
ms
OC-12
2.0
ms
OC-3
3.4
ms
OC-1
9.8
ms
12.3
Mb/s
40.0
ms
Optional Lock to REFCLK Mode
10.0
ms
DATA RATE READBACK ACCURACY
Coarse Readback
(See Table 13)
10
%
Fine Readback
In addition to REFCLK accuracy
Data rate < 20 Mb/s
200
ppm
Data rate > 20 Mb/s
100
ppm
POWER SUPPLY VOLTAGE
3.0
3.3
3.6
V
POWER
SUPPLY
CURRENT
90
mA
OPERATING TEMPERATURE RANGE
40
+85
C
ADN2815
Preliminary Technical Data
Rev. PrA | Page 4 of 27
JITTER SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, VCC = V
MIN
to V
MAX
, VEE = 0 V, C
F
= 0.47 uF, SLICEP = SLICEN = VEE, Input Data Pattern: PRBS 2
23
- 1,
unless otherwise noted.
Table 2.
Parameter Conditions
Min
Typ
Max
Unit
PHASE-LOCKED LOOP CHARACTERISTICS
Jitter Transfer BW
OC-12
71
108
kHz
OC-3
23
35
kHz
Jitter Peaking
OC-12
0
0.03
dB
OC-3
0
0.03
dB
Jitter Generation
OC-12, 12 kHz to 5 MHz
0.001
0.002
UI rms
0.01
0.019
UI
p-p
OC-3, 12 kHz to 1.3 MHz
0.001
0.002
UI rms
0.01
0.011
UI
p-p
Jitter Tolerance
1GbE, IEEE802.3
637kHz
0.749
UI p-p
OC-12,
2
23
- 1 PRBS
30
Hz
1
100
UI
p-p
300
Hz
1
44
UI
p-p
25 kHz
2.5
UI p-p
250
kHz
1
1.0
UI
p-p
OC-3,
2
23
- 1 PRBS
30
Hz
1
50
UI
p-p
300
Hz
1
24
UI
p-p
6500 Hz
3.5
UI p-p
65 kHz
1.0
UI p-p
1
Jitter tolerance of the ADN2815 at these jitter frequencies is better than what the test equipment is able to measure.
Preliminary Technical Data
ADN2815
Rev. PrA | Page 5 of 27
OUTPUT AND TIMING SPECIFICATIONS
Table 3.
Parameter Conditions
Min
Typ
Max
Unit
LVDS OUPUT CHARACTERISTICS
(CLKOUTP/N, DATAOUTP/N)
Single-Ended Output Swing
V
SE
(see Figure 3)
250
400
mV
Differential Output Swing
V
DIFF
(see Figure 3)
500
800
mV
Output Offset Voltage
1125
1200
1275
mV
Output Impedance
Differential
100
LVDS Ouputs Timing
Rise Time
20% to 80%
TBD
ps
Fall Time
80% to 20%
TBD
ps
Setup Time
T
S
(see Figure 2), GbE
400
ps
Hold Time
T
H
(see Figure 2), GbE
400
ps
I
2
C INTERFACE DC CHARACTERISTICS
LVCMOS
Input High Voltage
V
IH
0.7
VCC
V
Input Low Voltage
V
IL
0.3
VCC
V
Input Current
V
IN
= 0.1 VCC or V
IN
= 0.9 VCC
-10.0
+10.0
A
Output Low Voltage
V
OL
, I
OL
= 3.0 mA
0.4
V
I
2
C INTERFACE TIMING
(See Figure 9)
SCK Clock Frequency
400
kHz
SCK Pulse Width High
t
HIGH
600
ns
SCK Pulse Width Low
t
LOW
1300
ns
Start Condition Hold Time
t
HD;STA
600
ns
Start Condition Setup Time
t
SU;STA
600
ns
Data Setup Time
t
SU;DAT
100
ns
Data Hold Time
t
HD;DAT
300
ns
SCK/SDA Rise/Fall Time
T
R
/T
F
20 + 0.1 Cb
1
300
ns
Stop Condition Setup Time
t
SU;STO
600
ns
Bus Free Time between a Stop and a Start
t
BUF
1300
ns
REFCLK CHARACTERISTICS
Optional lock to REFCLK mode
Input Voltage Range
@ REFCLKP or REFCLKN
V
IL
0
V
V
IH
VCC
V
Minimum Differential Input Drive
100
mV p-p
Reference Frequency
12.3
200
MHz
Required Accuracy
100
ppm
LVTTL DC INPUT CHARACTERISTICS
Input High Voltage
V
IH
2.0
V
Input Low Voltage
V
IL
0.8
V
Input High Current
I
IH
, V
IN
= 2.4 V
5
A
Input Low Current
I
IL
, V
IN
= 0.4 V
-5
A
LVTTL DC OUTPUT CHARACTERISTICS
Output High Voltage
V
OH
, I
OH
= -2.0 mA
2.4
V
Output Low Voltage
V
OL
, I
OL
= 2.0 mA
0.4
V
1
C
b
= total capacitance of one bus line in pF. If mixed with Hs-mode devices, faster fall-times are allowed.
ADN2815
Preliminary Technical Data
Rev. PrA | Page 6 of 27
ABSOLUTE MAXIMUM RATINGS
T
A
= T
MIN
to T
MAX
, VCC = V
MIN
to V
MAX
, VEE = 0 V, C
F
= 0.47
F, SLICEP = SLICEN = VEE, unless otherwise noted.
Table 4.
Parameter Rating
Supply Voltage (VCC)
4.2 V
Minimum Input Voltage (All Inputs)
VEE - 0.4 V
Maximum Input Voltage (All Inputs)
VCC + 0.4 V
Maximum Junction Temperature
125C
Storage Temperature
-65C to +150C
Lead Temperature (Soldering 10 s)
300C
Stress above those listed under Absolute Maximum Ratings may
cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
Thermal Resistance
32-LFCSP, 4-layer board with exposed paddle soldered to VEE
JA
= 28C/W.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Preliminary Technical Data
ADN2815
Rev. PrA | Page 7 of 27
TIMING CHARACTERISTICS
04952-0-002
CLKOUTP
DATAOUTP/N
T
S
T
H
Figure 2. Output Timing
04952-0-003
OUTP
OUTN
OUTPOUTN
0V
V
SE
V
CML
V
SE
V
DIFF
Figure 3. Single-Ended vs. Differential Output Specifications
ADN2815
Preliminary Technical Data
Rev. PrA | Page 8 of 27
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
04952-0-004
TEST1 1
VCC 2
VREF 3
PIN 1
INDICATOR
TOP VIEW
(Not to Scale)
24 VCC
23 VEE
22 NC
21 SDA
32 TEST2
20 SCK
19 SADDR5
18 VCC
17 VEE
NC 9
REFCLKP 10
REFCLKN 11
V
CC 1
2
VEE 13
C
F
2 14
C
F
1 15
LOL 16
NIN 4
PIN 5
NC 6
NC 7
VEE 8
31 VC
C
30 VEE
29 DATAOUTP
28 DATAOUTN
27 SQU
E
LC
H
2
6
CLKOUTP
2
5
CLKOUTN
ADN2815*
* THERE IS AN EXPOSED PAD ON THE BOTTOM OF
THE PACKAGE THAT MUST BE CONNECTED TO GND.
Figure 4. Pin Configuration
Table 5. Pin Function Descriptions
Pin No.
Mnemonic
Type
1
Description
1
TEST1
Connect to VCC.
2
VCC
P
Power for Limamp, LOS.
3
VREF
AO
Internal VREF Voltage. Decouple to GND with a 0.1 F capacitor.
4
NIN
AI
Differential Data Input. CML.
5
PIN
AI
Differential Data Input. CML.
6 ,7
NC
No Connect
8
VEE
P
GND for Limamp, LOS.
9 NC
No
Connect
10
REFCLKP
DI
Differential REFCLK Input. 12.3 MHz to 200 MHz.
11
REFCLKN
DI
Differential REFCLK Input. 12.3 MHz to 200 MHz.
12
VCC
P
VCO Power.
13 VEE
P
VCO
GND.
14
CF2
AO
Frequency Loop Capacitor.
15
CF1
AO
Frequency Loop Capacitor.
16
LOL
DO
Loss of Lock Indicator. LVTTL active high.
17
VEE
P
FLL Detector GND.
18
VCC
P
FLL Detector Power.
19
SADDR5
DI
Slave Address Bit 5.
20 SCK
DI
I
2
C Clock Input.
21 SDA
DI
I
2
C Data Input.
22 NC
No
Connect
23
VEE
P
Output Buffer, I
2
C GND.
24
VCC
P
Output Buffer, I
2
C Power.
25
CLKOUTN
DO
Differential Recovered Clock Output. LVDS.
26
CLKOUTP
DO
Differential Recovered Clock Output. LVDS.
27
SQUELCH
DI
Disable Clock and Data Outputs. Active high. LVTLL.
28
DATAOUTN
DO
Differential Recovered Data Output. LVDS.
29
DATAOUTP
DO
Differential Recovered Data Output. LVDS.
30
VEE
P
Phase Detector, Phase Shifter GND.
31
VCC
P
Phase Detector, Phase Shifter Power.
32
TEST2
Connect to VCC.
Exposed Pad
Pad
P
Connect to GND
1
Type: P = power, AI = analog input, AO = analog output, DI = digital input, DO = digital output.
Preliminary Technical Data
ADN2815
Rev. PrA | Page 9 of 27
TYPICAL PERFORMANCE CHARACTERISTICS
ADN2815
Preliminary Technical Data
Rev. PrA | Page 10 of 27
I
2
C INTERFACE TIMING AND INTERNAL REGISTER DESCRIPTION
04952-0-007
1
A5
0
0
0
0
0
X
MSB = 1 SET BY
PIN 19
0 = WR
1 = RD
SLAVE ADDRESS [6...0]
R/W
CTRL.
Figure 5. Slave Address Configuration
04952-0-008
S SLAVE ADDR, LSB = 0 (WR) A(S)
A(S)
A(S)
DATA
SUB ADDR
A(S) P
DATA
Figure 6. I
2
C Write Data Transfer
04952-0-009
S
S = START BIT
P = STOP BIT
A(S) = ACKNOWLEDGE BY SLAVE
A(M) = ACKNOWLEDGE BY MASTER
A(M) = LACK OF ACKNOWLEDGE BY MASTER
S
SLAVE ADDR, LSB = 0 (WR)
SLAVE ADDR, LSB = 1 (RD)
A(S)
A(S)
SUB ADDR
A(S) DATA A(M)
DATA
P
A(M)
Figure 7. I
2
C Read Data Transfer
04952-0-010
START BIT
S
STOP BIT
P
ACK
ACK
WR
ACK
D0
D7
A0
A7
A5
A6
SLADDR[4...0]
SLAVE ADDRESS
SUB ADDRESS
DATA
SUB ADDR[6...1]
DATA[6...1]
SCK
SDA
Figure 8. I
2
C Data Transfer Timing
04952-0-011
t
BUF
SDA
S
S
P
S
SCK
t
F
t
LOW
t
R
t
F
t
HD;STA
t
HD;DAT
t
SU;DAT
t
HIGH
t
SU;STA
t
SU;STO
t
HD;STA
t
R
Figure 9. I
2
C Port Timing Diagram
Preliminary Technical Data
ADN2815
Rev. PrA | Page 11 of 27
Table 6. Internal Register Map
1
Reg Name
R/W
Address
D7
D6
D5
D4
D3
D2
D1
D0
FREQ0
R
0x0
MSB
LSB
FREQ1
R
0x1
MSB
LSB
FREQ2 R 0x2 0 MSB
LSB
RATE R 0x3
COARSE_RD[8]
MSB
Coarse datarate readback
COARSE_RD[1]
MISC R 0x4 x x x
Static
LOL
LOL
status
Datarate
measure
complete
x
COARSE_
RD[0] LSB
CTRLA W 0x8
F
REF
range
Datarate/DIV_F
REF
ratio
Measure
datarate
Lock to
reference
CTRLB W 0x9
Config
LOL
Reset
MISC[4]
System
reset
0
Reset
MISC[2]
0 0 0
CTRLC W 0x11 0 0
0
0
0
0
Squelch
mode
0
1
All writeable registers default to 0x00.
Table 7. Miscellaneous Register, MISC
Static
LOL
LOL
Status
Datarate Measurement
Complete
Coarse Rate
Readback LSB
D7 D6 D5 D4
D3
D2
D1 D0
x
x
x
0 = Waiting for next LOL
0 = Locked
0 = Measuring datarate
x
COARSE_RD[0]
1 = Static LOL until reset
1 = Acquiring
1 = Measurement complete
Table 8. Control Register, CTRLA
1
F
REF
Range
Datarate/Div_F
REF
Ratio
Measure Datarate
Lock to Reference
D7 D6
D5 D4 D3 D2
D1
D0
0
0
12.3 MHz to 25 MHz
0
0
0
0
1
Set to 1 to measure datarate
0 = Lock to input data
0
1
25 MHz to 50 MHz
0
0
0
1
2
1 = Lock to reference clock
1
0
50 MHz to 100 MHz
0
0
1
0
4
1
1
100 MHz to 200 MHz
n
2
n
1 0 0 0 256
1
Where DIV_F
REF
is the divided down reference referred to the 12.3 MHz to 25 MHz band (see the Reference Clock (Optional) section).
Table 9. Control Register, CTRLB
Config LOL
Reset MISC[4]
System Reset
Reset MISC[2]
D7
D6
D5
D4 D3
D2 D1 D0
0 = LOL pin normal operation
1 = LOL pin is static LOL
Write a 1 followed by
0 to reset MISC[4]
Write a 1 followed by
0 to reset ADN2815
Set
to 0
Write a 1 followed by
0 to reset MISC[2]
Set
to 0
Set
to 0
Set
to 0
Table 10. Control Register, CTRLC
Squelch
Mode
D7 D6 D5 D4 D3 D2 D1
D0
Set to 0
0 = Squelch CLK and DATA
Set to 0
Set to 0
Set to 0
Set to 0
Set to 0
Set to 0
1 = Squelch CLK or DATA
ADN2815
Preliminary Technical Data
Rev. PrA | Page 12 of 27
JITTER SPECIFICATIONS
The ADN2815 CDR is designed to achieve the best bit-error-
rate (BER) performance and exceeds the jitter transfer, genera-
tion, and tolerance specifications proposed for SONET/SDH
equipment defined in the Telcordia Technologies specification.
Jitter is the dynamic displacement of digital signal edges from
their long-term average positions, measured in unit intervals
(UI), where 1 UI = 1 bit period. Jitter on the input data can
cause dynamic phase errors on the recovered clock sampling
edge. Jitter on the recovered clock causes jitter on the
retimed data.
The following sections briefly summarize the specifications of
jitter generation, transfer, and tolerance in accordance with the
Telcordia document (GR-253-CORE, Issue 3, September 2000)
for the optical interface at the equipment level and the
ADN2815 performance with respect to those specifications.
JITTER GENERATION
The jitter generation specification limits the amount of jitter
that can be generated by the device with no jitter and wander
applied at the input. For SONET devices, the jitter generated
must be less than 0.01 UI rms, and must be less than 0.1 UIp-p.
JITTER TRANSFER
The jitter transfer function is the ratio of the jitter on the output
signal to the jitter applied on the input signal versus the
frequency. This parameter measures the limited amount of the
jitter on an input signal that can be transferred to the output
signal (see Figure 10).
04952-0-015
0.1
ACCEPTABLE
RANGE
f
C
JITTER FREQUENCY (kHz)
SLOPE = 20dB/DECADE
JITTER GAIN (
d
B)
Figure 10. Jitter Transfer Curve
JITTER TOLERANCE
The jitter tolerance is defined as the peak-to-peak amplitude of
the sinusoidal jitter applied on the input signal, which causes a
1 dB power penalty. This is a stress test intended to ensure that
no additional penalty is incurred under the operating
conditions (see Figure 11).
04952-0-016
15.00
1.50
0.15
f
0
f
1
f
2
f
3
f
4
JITTER FREQUENCY (kHz)
SLOPE = 20dB/DECADE
INPUT JITTER AMPLITUDE (UI p-p)
Figure 11. SONET Jitter Tolerance Mask
Preliminary Technical Data
ADN2815
Rev. PrA | Page 13 of 27
THEORY OF OPERATION
The ADN2815 is a delay- and phase-locked loop circuit for
clock recovery and data retiming from an NRZ encoded data
stream. The phase of the input data signal is tracked by two
separate feedback loops, which share a common control voltage.
A high speed delay-locked loop path uses a voltage controlled
phase shifter to track the high frequency components of input
jitter. A separate phase control loop, comprised of the VCO,
tracks the low frequency components of input jitter. The initial
frequency of the VCO is set by yet a third loop, which compares
the VCO frequency with the input data frequency and sets the
coarse tuning voltage. The jitter tracking phase-locked loop
controls the VCO by the fine-tuning control.
The delay- and phase-loops together track the phase of the
input data signal. For example, when the clock lags input data,
the phase detector drives the VCO to higher frequency, and also
increases the delay through the phase shifter; both these actions
serve to reduce the phase error between the clock and data. The
faster clock picks up phase, while the delayed data loses phase.
Because the loop filter is an integrator, the static phase error is
driven to zero.
Another view of the circuit is that the phase shifter implements
the zero required for frequency compensation of a second-order
phase-locked loop, and this zero is placed in the feedback path
and, thus, does not appear in the closed-loop transfer function.
Jitter peaking in a conventional second-order phase-locked loop
is caused by the presence of this zero in the closed-loop transfer
function. Because this circuit has no zero in the closed-loop
transfer, jitter peaking is minimized.
The delay- and phase-loops together simultaneously provide
wide-band jitter accommodation and narrow-band jitter
filtering. The linearized block diagram in Figure 12 shows that
the jitter transfer function, Z(s)/X(s), is a second-order low-pass
providing excellent filtering. Note that the jitter transfer has no
zero, unlike an ordinary second-order phase-locked loop. This
means that the main PLL loop has virtually zero jitter peaking
(see Figure 13). This makes this circuit ideal for signal regen-
erator applications, where jitter peaking in a cascade of
regenerators can contribute to hazardous jitter accumulation.
The error transfer, e(s)/X(s), has the same high-pass form as an
ordinary phase-locked loop. This transfer function is free to be
optimized to give excellent wide-band jitter accommodation,
because the jitter transfer function, Z(s)/X(s), provides the
narrow-band jitter filtering.
04952-0-017
X(s)
Z(s)
RECOVERED
CLOCK
e(s)
INPUT
DATA
d/sc
psh
o/s
1/n
d = PHASE DETECTOR GAIN
o = VCO GAIN
c = LOOP INTEGRATOR
psh = PHASE SHIFTER GAIN
n = DIVIDE RATIO
=
1
cn
do
s
2
+
n psh
o
s
+ 1
Z(s)
X(s)
JITTER TRANSFER FUNCTION
=
s
2
s
2
d psh
c
s
+
+
do
cn
e(s)
X(s)
TRACKING ERROR TRANSFER FUNCTION
Figure 12. ADN2815 PLL/DLL Architecture
ADN2815
Z(s)
X(s)
04952-0-018
FREQUENCY (kHz)
JITTER PEAKING
IN ORDINARY PLL
J
I
TTE
R GAIN (dB)
o
n psh
d psh
c
Figure 13. ADN2815 Jitter Response vs. Conventional PLL
The delay- and phase-loops contribute to overall jitter accom-
modation. At low frequencies of input jitter on the data signal,
the integrator in the loop filter provides high gain to track large
jitter amplitudes with small phase error. In this case, the VCO is
frequency modulated and jitter is tracked as in an ordinary
phase-locked loop. The amount of low frequency jitter that can
be tracked is a function of the VCO tuning range. A wider
tuning range gives larger accommodation of low frequency
jitter. The internal loop control voltage remains small for small
phase errors, so the phase shifter remains close to the center of
its range and thus contributes little to the low frequency jitter
accommodation.
ADN2815
Preliminary Technical Data
Rev. PrA | Page 14 of 27
At medium jitter frequencies, the gain and tuning range of the
VCO are not large enough to track input jitter. In this case, the
VCO control voltage becomes large and saturates, and the VCO
frequency dwells at one extreme of its tuning range or the other.
The size of the VCO tuning range, therefore, has only a small
effect on the jitter accommodation. The delay-locked loop
control voltage is now larger, and so the phase shifter takes on
the burden of tracking the input jitter. The phase shifter range,
in UI, can be seen as a broad plateau on the jitter tolerance
curve. The phase shifter has a minimum range of 2 UI at all
data rates.
The gain of the loop integrator is small for high jitter
frequencies, so that larger phase differences are needed to make
the loop control voltage big enough to tune the range of the
phase shifter. Large phase errors at high jitter frequencies
cannot be tolerated. In this region, the gain of the integrator
determines the jitter accommodation. Because the gain of the
loop integrator declines linearly with frequency, jitter accom-
modation is lower with higher jitter frequency. At the highest
frequencies, the loop gain is very small, and little tuning of the
phase shifter can be expected. In this case, jitter
accommodation is determined by the eye opening of the input
data, the static phase error, and the residual loop jitter
generation. The jitter accommodation is roughly 0.5 UI in this
region. The corner frequency between the declining slope and
the flat region is the closed loop bandwidth of the delay-locked
loop, which is roughly 1.5 MHz at 1.25Gb/s.
Preliminary Technical Data
ADN2815
Rev. PrA | Page 15 of 27
FUNCTIONAL DESCRIPTION
FREQUENCY ACQUISITION
The ADN2815 acquires frequency from the data over a range of
data frequencies from 12.3 Mb/s to 1.25 Gb/s. The lock detector
circuit compares the frequency of the VCO and the frequency
of the incoming data. When these frequencies differ by more
than 1000 ppm, LOL is asserted. This initiates a frequency
acquisition cycle. The VCO frequency is reset to the bottom of
its range, which is 12.3 MHz. The frequency detector then
compares this VCO frequency and the incoming data frequency
and increments the VCO frequency, if necessary. Initially, the
VCO frequency is incremented in large steps to aid fast acquisi-
tion. As the VCO frequency approaches the data frequency, the
step size is reduced until the VCO frequency is within 250 ppm
of the data frequency, at which point LOL is de-asserted.
Once LOL is de-asserted, the frequency-locked loop is turned
off. The PLL/DLL pulls in the VCO frequency the rest of the
way until the VCO frequency equals the data frequency.
The frequency loop requires a single external capacitor between
CF1 and CF2, Pins 14 and 15. A 0.47 F 20%, X7R ceramic
chip capacitor with < 10 nA leakage current is recommended.
Leakage current of the capacitor can be calculated by dividing
the maximum voltage across the 0.47 F capacitor, ~3 V, by the
insulation resistance of the capacitor. The insulation resistance
of the 0.47 uF capacitor should be greater than 300 M.
INPUT BUFFER
The input buffer has differential inputs (PIN/NIN), which are
internally terminated with 50 to an on-chip voltage reference
(VREF = 2.5 V typically). The minimum differential input level
required to achieve a BER of 10e-10 is 200mVpp.
LOCK DETECTOR OPERATION
The lock detector on the ADN2815 has three modes of
operation: normal mode, REFCLK mode, and static LOL mode.
Normal Mode
In normal mode, the ADN2815 is a continuous rate CDR that
locks onto any data rate from 12.3 Mb/s to 1.25 Gb/s without
the use of a reference clock as an acquisition aid. In this mode,
the lock detector monitors the frequency difference between the
VCO and the input data frequency, and de-asserts the loss of
lock signal, which appears on LOL Pin 16, when the VCO is
within 250 ppm of the data frequency. This enables the D/PLL,
which pulls the VCO frequency in the remaining amount and
also acquires phase lock. Once locked, if the input frequency
error exceeds 1000 ppm (0.1%), the loss of lock signal is re-
asserted and control returns to the frequency loop, which
begins a new frequency acquisition starting at the lowest point
in the VCO operating range, 12.3 MHz. The LOL pin remains
asserted until the VCO locks onto a valid input data stream to
within 250 ppm frequency error. This hysteresis is shown in
Figure 14.
04952-0-020
LOL
0
250
250
1000
f
VCO
ERROR
(ppm)
1000
1
Figure 14. Transfer Function of LOL
LOL Detector Operation Using a Reference Clock
In this mode, a reference clock is used as an acquisition aid to
lock the ADN2815 VCO. Lock to reference mode is enabled by
setting CTRLA[0] to 1. The user also needs to write to the
CTRLA[7:6] and CTRLA[5:2] bits in order to set the reference
frequency range and the divide ratio of the data rate with
respect to the reference frequency. For more details, see the
Reference Clock (Optional) section. In this mode, the lock
detector monitors the difference in frequency between the
divided down VCO and the divided down reference clock. The
loss of lock signal, which appears on the LOL Pin 16, is de-
asserted when the VCO is within 250 ppm of the desired
frequency. This enables the D/PLL, which pulls the VCO
frequency in the remaining amount with respect to the input
data and also acquires phase lock. Once locked, if the input
frequency error exceeds 1000 ppm (0.1%), the loss of lock signal
is re-asserted and control returns to the frequency loop, which
re-acquires with respect to the reference clock. The LOL pin
remains asserted until the VCO frequency is within 250 ppm of
the desired frequency. This hysteresis is shown in Figure 14.
Static LOL Mode
The ADN2815 implements a static LOL feature, which indicates
if a loss of lock condition has ever occurred and remains
asserted, even if the ADN2815 regains lock, until the static LOL
bit is manually reset. The I
2
C register bit, MISC[4], is the static
LOL bit. If there is ever an occurrence of a loss of lock
condition, this bit is internally asserted to logic high. The
MISC[4] bit remains high even after the ADN2815 has re-
acquired lock to a new data rate. This bit can be reset by writing
a 1 followed by 0 to I
2
C Register Bit CTRLB[6]. Once reset, the
MISC[4] bit remains de-asserted until another loss of lock
condition occurs.
Writing a 1 to I
2
C Register Bit CTRLB[7] causes the LOL pin,
Pin 16, to become a static LOL indicator. In this mode, the LOL
pin mirrors the contents of the MISC[4] bit and has the
functionality described in the previous paragraph. The
CTRLB[7] bit defaults to 0. In this mode, the LOL pin operates
in the normal operating mode, that is, it is asserted only when
ADN2815
Preliminary Technical Data
Rev. PrA | Page 16 of 27
the ADN2815 is in acquisition mode and de-asserts when the
ADN2815 has re-acquired lock.
HARMONIC DETECTOR
The ADN2815 provides a harmonic detector, which detects
whether or not the input data has changed to a lower harmonic
of the data rate that the VCO is currently locked onto. For
example, if the input data instantaneously changes from OC-12,
622.08Mb/s, to an OC-3, 155.52 Mb/s bit stream, this could be
perceived as a valid OC-12 bit stream, because the OC-3 data
pattern is exactly 4 slower than the OC-12 pattern. So, if the
change in data rate is instantaneous, a 101 pattern at OC-3
would be perceived by the ADN2815 as a 111100001111 pattern
at OC-12. If the change to a lower harmonic is instantaneous, a
typical CDR could remain locked at the higher data rate.
The ADN2815 implements a harmonic detector that automati-
cally identifies whether or not the input data has switched to a
lower harmonic of the data rate that the VCO is currently
locked onto. When a harmonic is identified, the LOL pin is
asserted and a new frequency acquisition is initiated. The
ADN2815 automatically locks onto the new data rate, and the
LOL pin is de-asserted.
However, the harmonic detector does not detect higher
harmonics of the data rate. If the input data rate switches to a
higher harmonic of the data rate the VCO is currently locked
onto, the VCO loses lock, the LOL pin is asserted, and a new
frequency acquisition is initiated. The ADN2815 automatically
locks onto the new data rate.
The time to detect lock to harmonic is
16,384 (T
d
/)
where:
1/T
d
is the new data rate. For example, if the data rate is
switched from OC-12 to OC-3, then T
d
= 1/155.52 MHz.
is the data transition density. Most coding schemes seek to
ensure that = 0.5, for example, PRBS, 8B/10B.
When the ADN2815 is placed in lock to reference mode, the
harmonic detector is disabled.
SQUELCH MODE
Two squelch modes are available with the ADN2815. Squelch
DATAOUT AND CLKOUT mode is selected when CTRLC[1] =
0 (default mode). In this mode, when the squelch input, Pin 27,
is driven to a TTL high state, both the clock and data outputs
are set to the zero state to suppress downstream processing. If
the squelch function is not required, Pin 27 should be tied to
VEE.
Squelch DATAOUT OR CLKOUT mode is selected when
CTRLC[1] is 1. In this mode, when the squelch input is driven
to a high state, the DATAOUT pins are squelched. When the
squelch input is driven to a low state, the CLKOUT pins are
squelched. This is especially useful in repeater applications,
where the recovered clock may not be needed.
I
2
C INTERFACE
The ADN2815 supports a 2-wire, I
2
C compatible, serial bus
driving multiple peripherals. Two inputs, serial data (SDA) and
serial clock (SCK), carry information between any devices
connected to the bus. Each slave device is recognized by a
unique address. The ADN2815 has two possible 7-bit slave
addresses for both read and write operations. The MSB of the
7-bit slave address is factory programmed to 1. B5 of the slave
address is set by Pin 19, SADDR5. Slave address bits [4:0] are
defaulted to all 0s. The slave address consists of the 7 MSBs of
an 8-bit word. The LSB of the word sets either a read or write
operation (see Figure 5). Logic 1 corresponds to a read
operation, while Logic 0 corresponds to a write operation.
To control the device on the bus, the following protocol must be
followed. First, the master initiates a data transfer by establish-
ing a start condition, defined by a high to low transition on
SDA while SCK remains high. This indicates that an
address/data stream follows. All peripherals respond to the start
condition and shift the next eight bits (the 7-bit address and the
R/W bit). The bits are transferred from MSB to LSB. The
peripheral that recognizes the transmitted address responds by
pulling the data line low during the ninth clock pulse. This is
known as an acknowledge bit. All other devices withdraw from
the bus at this point and maintain an idle condition. The idle
condition is where the device monitors the SDA and SCK lines
waiting for the start condition and correct transmitted address.
The R/W bit determines the direction of the data. Logic 0 on
the LSB of the first byte means that the master writes
information to the peripheral. Logic 1 on the LSB of the first
byte means that the master reads information from the
peripheral.
The ADN2815 acts as a standard slave device on the bus. The
data on the SDA pin is 8 bits long supporting the 7-bit addresses
plus the R/W bit. The ADN2815 has 8 subaddresses to enable
the user-accessible internal registers (see Error! Reference
source not found.
through Table 7). It, therefore, interprets the
first byte as the device address and the second byte as the
starting subaddress. Autoincrement mode is supported,
allowing data to be read from or written to the starting
subaddress and each subsequent address without manually
addressing the subsequent subaddress. A data transfer is always
terminated by a stop condition. The user can also access any
unique subaddress register on a one-by-one basis without
updating all registers.
Stop and start conditions can be detected at any stage of the
data transfer. If these conditions are asserted out of sequence
with normal read and write operations, then they cause an
immediate jump to the idle condition. During a given SCK high
period, the user should issue one start condition, one stop
Preliminary Technical Data
ADN2815
Rev. PrA | Page 17 of 27
condition, or a single stop condition followed by a single start
condition. If an invalid subaddress is issued by the user, the
ADN2815 does not issue an acknowledge and returns to the idle
condition. If the user exceeds the highest subaddress while
reading back in autoincrement mode, then the highest subad-
dress register contents continue to be output until the master
device issues a no-acknowledge. This indicates the end of a
read. In a no-acknowledge condition, the SDATA line is not
pulled low on the ninth pulse. See Figure 6 and Figure 7 for
sample read and write data transfers and Figure 8 for a more
detailed timing diagram.
REFERENCE CLOCK (OPTIONAL)
A reference clock is not required to perform clock and data
recovery with the ADN2815. However, support for an optional
reference clock is provided. The reference clock can be driven
differentially or single-ended. If the reference clock is not being
used, then REFCLKP should be tied to VCC, and REFCLKN
can be left floating or tied to VEE (the inputs are internally
terminated to VCC/2). See Figure 15 through Figure 17 for
sample configurations.
The REFCLK input buffer accepts any differential signal with a
peak-to-peak differential amplitude of greater than 100 mV (for
example, LVPECL or LVDS) or a standard single-ended low
voltage TTL input, providing maximum system flexibility.
Phase noise and duty cycle of the reference clock are not critical
and 100 ppm accuracy is sufficient.
04952-0-021
100k
VCC/2
100k
ADN2815
REFCLKP
10
11
REFCLKN
BUFFER
Figure 15. Differential REFCLK Configuration
04952-0-022
100k
VCC/2
100k
ADN2815
REFCLKP
OUT
REFCLKN
BUFFER
VCC
CLK
OSC
Figure 16. Single-Ended REFCLK Configuration
04952-0-023
100k
VCC/2
100k
ADN2815
REFCLKP
10
11
NC
REFCLKN
BUFFER
VCC
Figure 17. No REFCLK Configuration
The two uses of the reference clock are mutually exclusive. The
reference clock can be used either as an acquisition aid for the
ADN2815 to lock onto data, or to measure the frequency of the
incoming data to within 0.01%. (There is the capability to
measure the data rate to approximately 10% without the use of
a reference clock.) The modes are mutually exclusive, because,
in the first use, the user knows exactly what the data rate is and
wants to force the part to lock onto only that data rate; in the
second use, the user does not know what the data rate is and
wants to measure it.
Lock to reference mode is enabled by writing a 1 to I
2
C Register
Bit CTRLA[0]. Fine data rate readback mode is enabled by
writing a 1 to I
2
C Register Bit CTRLA[1]. Writing a 1 to both of
these bits at the same time causes an indeterminate state and is
not supported.
Using the Reference Clock to Lock onto Data
In this mode, the ADN2815 locks onto a frequency derived
from the reference clock according to the following equation:
Data Rate/2
CTRLA[5:2]
= REFCLK/2
CTRLA[7:6]
The user must know exactly what the data rate is, and provide a
reference clock that is a function of this rate. The ADN2815 can
still be used as a continuous rate device in this configuration,
provided that the user has the ability to provide a reference
clock that has a variable frequency (see Application Note
AN-632).
The reference clock can be anywhere between 12.3 MHz and
200 MHz. By default, the ADN2815 expects a reference clock of
between 12.3 MHz and 25 MHz. If it is between 25 MHz and
50 MHz, 50 MHz and 100 MHz, or 100 MHz and 200 MHz, the
user needs to configure the ADN2815 to use the correct
reference frequency range by setting two bits of the CTRLA
register, CTRLA[7:6].
Table 11. CTRLA Settings
CTRLA[7:6] Range
(MHz)
CTRLA[5:2] Ratio
00
12.3 to 25
0000
1
01
25 to 50
0001
2
10
50 to 100
n
2
n
11
100 to 200
1000
256
ADN2815
Preliminary Technical Data
Rev. PrA | Page 18 of 27
The user can specify a fixed integer multiple of the reference
clock to lock onto using CTRLA[5:2], where CTRLA should be
set to the data rate/DIV_F
REF
, where DIV_F
REF
represents the
divided-down reference referred to the 12.3 MHz to 25 MHz
band. For example, if the reference clock frequency was
38.88 MHz and the input data rate was 622.08 Mb/s, then
CTRLA[7:6] would be set to [01] to give a divided-down
reference clock of 19.44 MHz. CTRLA[5:2] would be set to
[0101], that is, 5, because
622.08 Mb/s/19.44 MHz = 2
5
In this mode, if the ADN2815 loses lock for any reason, it
relocks onto the reference clock and continues to output a stable
clock.
While the ADN2815 is operating in lock to reference mode, if
the user ever changes the reference frequency, the F
REF
range
(CTRLA[7:6]), or the F
REF
ratio (CTRLA[5:2]), this must be
followed by writing a 0 to 1 transition into the CTRLA[0] bit to
initiate a new lock to reference command.
Using the Reference Clock to Measure Data Frequency
The user can also provide a reference clock to measure the
recovered data frequency. In this case, the user provides a
reference clock, and the ADN2815 compares the frequency of
the incoming data to the incoming reference clock and returns a
ratio of the two frequencies to 0.01% (100 ppm). The accuracy
error of the reference clock is added to the accuracy of the
ADN2815 data rate measurement. For example, if a 100-ppm
accuracy reference clock is used, the total accuracy of the
measurement is within 200 ppm.
The reference clock can range from 12.3 MHz and 200 MHz.
The ADN2815 expects a reference clock between 12.3 MHz and
25 MHz by default. If it is between 25 MHz and 50 MHz,
50 MHz and 100 MHz, or 100 MHz and 200 MHz, the user
needs to configure the ADN2815 to use the correct reference
frequency range by setting two bits of the CTRLA register,
CTRLA[7:6]. Using the reference clock to determine the
frequency of the incoming data does not affect the manner in
which the part locks onto data. In this mode, the reference clock
is used only to determine the frequency of the data. For this
reason, the user does not need to know the data rate to use the
reference clock in this manner.
Prior to reading back the data rate using the reference clock, the
CTRLA[7:6] bits must be set to the appropriate frequency range
with respect to the reference clock being used. A fine data rate
readback is then executed as follows:
Step 1: Write a 1 to CTRLA[1]. This enables the fine data rate
measurement capability of the ADN2815. This bit is level
sensitive and does not need to be reset to perform subsequent
frequency measurements.
Step 2: Reset MISC[2] by writing a 1 followed by a 0 to
CTRLB[3]. This initiates a new data rate measurement.
Step 3: Read back MISC[2]. If it is 0, then the measurement is
not complete. If it is 1, then the measurement is complete and
the data rate can be read back on FREQ[22:0]. The time for a
data rate measurement is typically 80 ms.
Step 4: Read back the data rate from registers FREQ2[6:0],
FREQ1[7:0], and FREQ0[7:0].
Use the following equation to determine the data rate:
[
]
(
)
)
_
14
(
2
/
0
..
22
RATE
SEL
REFCLK
DATARATE
f
FREQ
f
+
=
where:
FREQ[22:0] is the reading from FREQ2[6:0] (MSByte),
FREQ1[7:0], and FREQ0[7:0] (LSByte).
Table 12.
D22 D21...D17 D16 D15 D14...D9 D8 D7 D6...D1 D0
FREQ2[6:0] FREQ1[7:0]
FREQ0[7:0]
f
DATARATE
is the data rate (Mb/s).
f
REFCLK
is the REFCLK frequency (MHz).
SEL_RATE is the setting from CTRLA[7:6].
For example, if the reference clock frequency is 32 MHz,
SEL_RATE = 1, since the CTRLA[7:6] setting would be [01],
because the reference frequency would fall into the 25 MHz to
50 MHz range. Assume for this example that the input data rate
is 1.25 Gb/s (GbE). After following Steps 1 through 4, the value
that is read back on FREQ[22:0] = 0x138800, which is equal to
1.28 10
6
. Plugging this value into the equation yields
(
)
(
)
Gb/s
25
.
1
2
/
6
e
32
6
e
28
.
1
)
1
14
(
=
+
If subsequent frequency measurements are required, CTRLA[1]
should remain set to 1. It does not need to be reset. The
measurement process is reset by writing a 1 followed by a 0 to
CTRLB[3]. This initiates a new data rate measurement. Follow
Steps 2 through 4 to read back the new data rate.
Note: A data rate readback is valid only if LOL is low. If LOL is
high, the data rate readback is invalid.
Preliminary Technical Data
ADN2815
Rev. PrA | Page 19 of 27
Additional Features Available via the I
2
C Interface
Coarse Data Rate Readback
The data rate can be read back over the I
2
C interface to
approximately +10% without the need of an external reference
clock. A 9-bit register, COARSE_RD[8:0], can be read back
when LOL is de-asserted. The 8 MSBs of this register are the
contents of the RATE[7:0] register. The LSB of the
COARSE_RD register is Bit MISC[0].
Table 13 provides coarse data rate readback to within 10%.
System Reset
A frequency acquisition can be initiated by writing a 1 followed
by a 0 to the I
2
C Register Bit CTRLB[5]. This initiates a new
frequency acquisition while keeping the ADN2815 in the
operating mode that it was previously programmed to in
registers CTRL[A], CTRL[B], and CTRL[C].
ADN2815
Preliminary Technical Data
Rev. PrA | Page 20 of 27
APPLICATIONS INFORMATION
PCB DESIGN GUIDELINES
Proper RF PCB design techniques must be used for optimal
performance.
Power Supply Connections and Ground Planes
Use of one low impedance ground plane is recommended. The
VEE pins should be soldered directly to the ground plane to
reduce series inductance. If the ground plane is an internal
plane and connections to the ground plane are made through
vias, multiple vias can be used in parallel to reduce the series
inductance, especially on Pin 23, which is the ground return for
the output buffers. The exposed pad should be connected to the
GND plane using plugged vias so that solder does not leak
through the vias during reflow.
Use of a 22 F electrolytic capacitor between VCC and VEE is
recommended at the location where the 3.3 V supply enters the
PCB. When using 0.1 F and 1 nF ceramic chip capacitors, they
should be placed between the IC power supply VCC and VEE,
as close as possible to the ADN2815 VCC pins.
If connections to the supply and ground are made through vias,
the use of multiple vias in parallel helps to reduce series
inductance, especially on Pin 24, which supplies power to the
high speed CLKOUTP/CLKOUTN and DATAOUTP/
DATAOUTN output buffers. Refer to the schematic in Figure
18 for recommended connections.
By using adjacent power supply and GND planes, excellent high
frequency decoupling can be realized by using close spacing
between the planes. This capacitance is given by
( )
pF
88
.
0
A/d
C
r
plane
=
where:
r
is the dielectric constant of the PCB material.
A is the area of the overlap of power and GND planes (cm
2
).
d is the separation between planes (mm).
For FR-4,
r
= 4.4 mm and 0.25 mm spacing, C ~15 pF/cm
2
.
50
TRANSMISSION LINES
DATAOUTP
DATAOUTN
CLKOUTP
CLKOUTN
0.1
F
22
F
1nF
0.1
F
0.1
F
0.1
F
0.1
F
0.47
F 20%
>300M
INSULATION RESISTANCE
1nF
1nF
1nF
0.1
F
1nF
+
VCC
50
50
OPTICAL
TRANSCEIVER
MODULE
R
TH
VCC
NC
C
I
2
C CONTROLLER
I
2
C CONTROLLER
VCC
VCC
04952-0-031
1
TEST1
2
VCC
3
VREF
4
NIN
5
PIN
6
NC
7
NC
8
VEE
24
VCC
23
VEE
22
NC
21
SDA
20
SCK
19
SADDR5
18
VCC
17
VEE
9
T
H
R
A
D
J
1
0
R
E
F
C
L
K
P
1
1
R
E
F
C
L
K
N
1
2
V
C
C
1
3
V
E
E
1
4
C
F
2
1
5
C
F
1
1
6
L
O
L
3
2
T
E
S
T
2
3
1
V
C
C
3
0
V
E
E
2
9
D
A
T
A
O
U
T
P
2
8
D
A
T
A
O
U
T
N
2
7
S
Q
U
E
L
C
H
2
6
C
L
K
O
U
T
P
2
5
C
L
K
O
U
T
N
EXPOSED PAD
TIED OFF TO
VEE PLANE
WITH VIAS
Figure 18. Typical ADN2815 Applications Circuit
Preliminary Technical Data
ADN2815
Rev. PrA | Page 21 of 27
Transmission Lines
Use of 50 transmission lines is required for all high frequency
input and output signals to minimize reflections: PIN, NIN,
CLKOUTP, CLKOUTN, DATAOUTP, DATAOUTN (also
REFCLKP, REFCLKN, if a high frequency reference clock is
used, such as 155 MHz). It is also necessary for the PIN/NIN
input traces to be matched in length, and the CLKOUTP/N and
DATAOUTP/N output traces to be matched in length to avoid
skew between the differential traces. The high speed inputs,
PIN and NIN, are internally terminated with 50 to an
internal reference voltage (see Figure 19). A 0.1 F is
recommended between VREF, Pin 3, and GND to provide an ac
ground for the inputs.
As with any high speed mixed-signal design, take care to keep
all high speed digital traces away from sensitive analog nodes.
04952-0-026
C
IN
C
IN
50
0.1
F
50
3k
NIN
PIN
ADN2815
2.5V
VREF
50
50
TIA
VCC
Figure 19. ADN2815 AC-Coupled Input Configuration
Soldering Guidelines for Chip Scale Package
The lands on the 32 LFCSP are rectangular. The printed circuit
board pad for these should be 0.1 mm longer than the package
land length and 0.05 mm wider than the package land width.
The land should be centered on the pad. This ensures that the
solder joint size is maximized. The bottom of the chip scale
package has a central exposed pad. The pad on the printed
circuit board should be at least as large as this exposed pad. The
user must connect the exposed pad to VEE using plugged vias
so that solder does not leak through the vias during reflow. This
ensures a solid connection from the exposed pad to VEE.
Choosing AC Coupling Capacitors
AC coupling capacitors at the input (PIN, NIN) and output
(DATAOUTP, DATAOUTN) of the ADN2815 must be chosen
such that the device works properly over the full range of data
rates used in the application. When choosing the capacitors, the
time constant formed with the two 50 resistors in the signal
path must be considered. When a large number of consecutive
identical digits (CIDs) are applied, the capacitor voltage can
droop due to baseline wander (see Figure 20), causing pattern-
dependent jitter (PDJ).
The user must determine how much droop is tolerable and
choose an ac coupling capacitor based on that amount of droop.
The amount of PDJ can then be approximated based on the
capacitor selection. The actual capacitor value selection may
require some trade-offs between droop and PDJ.
Example: Assuming that 2% droop can be tolerated, then the
maximum differential droop is 4%. Normalizing to V
pp
:
Droop = V = 0.04 V = 0.5 V
pp
(1 - e
t/
) ; therefore, = 12t
where:
is the RC time constant (C is the ac coupling capacitor, R =
100 seen by C).
t is the total discharge time, which is equal to n
.
n is the number of CIDs.
T is the bit period.
The capacitor value can then be calculated by combining the
equations for and t:
R
nT
C
/
12
=
Once the capacitor value is selected, the PDJ can be
approximated as
(
)
(
)
6
.
0
/
1
5
.
0
r
nT/RC
pspp
e
t
PDJ
-
-
=
where:
PDJ
pspp
is the amount of pattern-dependent jitter allowed;
< 0.01 UI p-p typical.
t
r
is the rise time, which is equal to 0.22/BW,
where BW ~ 0.7 (bit rate).
Note that this expression for t
r
is accurate only for the inputs.
The output rise time for the ADN2815 is ~100 ps regardless of
data rate.
ADN2815
Preliminary Technical Data
Rev. PrA | Page 22 of 27
04952-0-027
50
50
PIN
V
REF
NIN
C
IN
C
OUT
C
OUT
V1
C
IN
V1b
V2
V2b
TIA
BUFFER
CDR
+
VCC
DATAOUTP
DATAOUTN
1
V1
V1b
V2
V2b
V
DIFF
2
3
4
VREF
VTH
ADN2815
V
DIFF
= V2V2b
VTH = ADN2815 QUANTIZER THRESHOLD
NOTES:
1. DURING DATA PATTERNS WITH HIGH TRANSITION DENSITY, DIFFERENTIAL DC VOLTAGE AT V1 AND V2 IS ZERO.
2. WHEN THE OUTPUT OF THE TIA GOES TO CID, V1 AND V1b ARE DRIVEN TO DIFFERENT DC LEVELS. V2 AND V2b DISCHARGE TO THE
VREF LEVEL, WHICH EFFECTIVELY INTRODUCES A DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS.
3. WHEN THE BURST OF DATA STARTS AGAIN, THE DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS IS APPLIED TO
THE INPUT LEVELS CAUSING A DC SHIFT IN THE DIFFERENTIAL INPUT. THIS SHIFT IS LARGE ENOUGH SUCH THAT ONE OF THE STATES,
EITHER HIGH OR LOW DEPENDING ON THE LEVELS OF V1 AND V1b WHEN THE TIA WENT TO CID, IS CANCELED OUT. THE QUANTIZER
DOES NOT RECOGNIZE THIS AS A VALID STATE.
4. THE DC OFFSET SLOWLY DISCHARGES UNTIL THE DIFFERENTIAL INPUT VOLTAGE EXCEEDS THE SENSITIVITY OF THE ADN2815. THE
QUANTIZER CAN RECOGNIZE BOTH HIGH AND LOW STATES AT THIS POINT.
Figure 20. Example of Baseline Wander
Preliminary Technical Data
ADN2815
Rev. PrA | Page 23 of 27
COARSE DATA RATE READBACK LOOK-UP TABLE
Code is the 9-bit value read back from COARSE_RD[8:0].
Table 13. Look-Up Table
Code F
MID
0 5.1934e+06
1 5.1930e+06
2 5.2930e+06
3 5.3989e+06
4 5.5124e+06
5 5.6325e+06
6
5.7612e+06
7 5.8995e+06
8 6.0473e+06
9 6.2097e+06
10 6.3819e+06
11 6.5675e+06
12 6.7688e+06
13 6.9874e+06
14 7.2262e+06
15 7.4863e+06
16 7.4139e+06
17 7.4135e+06
18 7.5606e+06
19 7.7173e+06
20 7.8852e+06
21 8.0633e+06
22 8.2548e+06
23 8.4586e+06
24 8.6784e+06
25 8.9180e+06
26 9.1736e+06
27 9.4481e+06
28 9.7464e+06
29 1.0068e+07
30 1.0417e+07
31 1.0791e+07
32 1.0387e+07
33 1.0386e+07
34 1.0586e+07
35 1.0798e+07
36 1.1025e+07
37 1.1265e+07
38 1.1522e+07
39 1.1799e+07
40 1.2095e+07
41 1.2419e+07
42 1.2764e+07
43 1.3135e+07
44 1.3538e+07
45 1.3975e+07
46 1.4452e+07
47 1.4973e+07
Code F
MID
48 1.4828e+07
49 1.4827e+07
50 1.5121e+07
51 1.5435e+07
52 1.5770e+07
53 1.6127e+07
54 1.6510e+07
55 1.6917e+07
56 1.7357e+07
57 1.7836e+07
58 1.8347e+07
59 1.8896e+07
60 1.9493e+07
61 2.0136e+07
62 2.0833e+07
63 2.1582e+07
64 2.0774e+07
65 2.0772e+07
66 2.1172e+07
67 2.1596e+07
68 2.2049e+07
69 2.2530e+07
70 2.3045e+07
71 2.3598e+07
72 2.4189e+07
73 2.4839e+07
74 2.5527e+07
75 2.6270e+07
76 2.7075e+07
77 2.7950e+07
78 2.8905e+07
79 2.9945e+07
80 2.9655e+07
81 2.9654e+07
82 3.0242e+07
83 3.0869e+07
84 3.1541e+07
85 3.2253e+07
86 3.3019e+07
87 3.3834e+07
88 3.4714e+07
89 3.5672e+07
90 3.6694e+07
91 3.7792e+07
92 3.8985e+07
93 4.0273e+07
94 4.1666e+07
95 4.3164e+07
Code F
MID
96 4.1547e+07
97 4.1544e+07
98 4.2344e+07
99 4.3191e+07
100 4.4099e+07
101 4.5060e+07
102 4.6090e+07
103 4.7196e+07
104 4.8378e+07
105 4.9678e+07
106 5.1055e+07
107 5.2540e+07
108 5.4150e+07
109 5.5899e+07
110 5.7810e+07
111 5.9890e+07
112 5.9311e+07
113 5.9308e+07
114 6.0485e+07
115 6.1739e+07
116 6.3081e+07
117 6.4506e+07
118 6.6038e+07
119 6.7669e+07
120 6.9427e+07
121 7.1344e+07
122 7.3388e+07
123 7.5585e+07
124 7.7971e+07
125 8.0546e+07
126 8.3333e+07
127 8.6328e+07
128 8.3095e+07
129 8.3087e+07
130 8.4689e+07
131 8.6383e+07
132 8.8198e+07
133 9.0120e+07
134 9.2179e+07
135 9.4392e+07
136 9.6757e+07
137 9.9356e+07
138 1.0211e+08
139 1.0508e+08
140 1.0830e+08
141 1.1180e+08
142 1.1562e+08
143 1.1978e+08
Code F
MID
144 1.1862e+08
145 1.1862e+08
146 1.2097e+08
147 1.2348e+08
148 1.2616e+08
149 1.2901e+08
150 1.3208e+08
151 1.3534e+08
152 1.3885e+08
153 1.4269e+08
154 1.4678e+08
155 1.5117e+08
156 1.5594e+08
157 1.6109e+08
158 1.6667e+08
159 1.7266e+08
160 1.6619e+08
161 1.6617e+08
162 1.6938e+08
163 1.7277e+08
164 1.7640e+08
165 1.8024e+08
166 1.8436e+08
167 1.8878e+08
168 1.9351e+08
169 1.9871e+08
170 2.0422e+08
171 2.1016e+08
172 2.1660e+08
173 2.2360e+08
174 2.3124e+08
175 2.3956e+08
176 2.3724e+08
177 2.3723e+08
178 2.4194e+08
179 2.4695e+08
180 2.5233e+08
181 2.5802e+08
182 2.6415e+08
183 2.7067e+08
184 2.7771e+08
185 2.8538e+08
186 2.9355e+08
187 3.0234e+08
188 3.1188e+08
189 3.2218e+08
190 3.3333e+08
191 3.4531e+08
ADN2815
Preliminary Technical Data
Rev. PrA | Page 24 of 27
Code F
MID
192 3.3238e+08
193 3.3235e+08
194 3.3876e+08
195 3.4553e+08
196 3.5279e+08
197 3.6048e+08
198 3.6872e+08
199 3.7757e+08
200 3.8703e+08
201 3.9742e+08
202 4.0844e+08
203 4.2032e+08
204 4.3320e+08
205 4.4719e+08
206 4.6248e+08
207 4.7912e+08
Code F
MID
208 4.7449e+08
209 4.7447e+08
210 4.8388e+08
211 4.9391e+08
212 5.0465e+08
213 5.1605e+08
214 5.2831e+08
215 5.4135e+08
216 5.5542e+08
217 5.7075e+08
218 5.8711e+08
219 6.0468e+08
220 6.2377e+08
221 6.4437e+08
222 6.6666e+08
223 6.9062e+08
Code F
MID
224 6.6476e+08
225 6.6470e+08
226 6.7751e+08
227 6.9106e+08
228 7.0558e+08
229 7.2096e+08
230 7.3743e+08
231 7.5514e+08
232 7.7405e+08
233 7.9485e+08
234 8.1688e+08
235 8.4064e+08
236 8.6640e+08
237 8.9438e+08
238 9.2496e+08
239 9.5825e+08
Code F
MID
240 9.4898e+08
241 9.4893e+08
242 9.6776e+08
243 9.8782e+08
244 1.0093e+09
245 1.0321e+09
246 1.0566e+09
247 1.0827e+09
248 1.1108e+09
249 1.1415e+09
250 1.1742e+09
251 1.2094e+09
252 1.2475e+09
253 1.2887e+09
254 1.3333e+09
255 1.3812e+09
Preliminary Technical Data
ADN2815
Rev. PrA | Page 25 of 27
OUTLINE DIMENSIONS
COMPLIANT TO JEDEC STANDARDS MO-220-VHHD-2
0.30
0.23
0.18
0.20 REF
0.80 MAX
0.65 TYP
0.05 MAX
0.02 NOM
12 MAX
1.00
0.85
0.80
SEATING
PLANE
COPLANARITY
0.08
1
32
8
9
25
24
16
17
BOTTOM
VIEW
0.50
0.40
0.30
3.50 REF
0.50
BSC
3.25
3.10 SQ
2.95
0.60 MAX
0.60 MAX
0.25 MIN
TOP
VIEW
PIN 1
INDICATOR
PIN 1
INDICATOR
5.00
BSC SQ
4.75
BSC SQ
Figure 21. 32-Lead Frame Chip Scale Package [LFCSP]
(CP-32)
Dimensions shown in millimeters
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Option
ADN2815ACP
-40C to 85C
32-LFCSP
CP-32
ADN2815ACP-RL
-40C to 85C
32-LFCSP, tape-reel, 2500 pcs
CP-32
ADN2815ACP-RL7
-40C to 85C
32-LFCSP, tape-reel, 1500 pcs
CP-32
ADN2815
Preliminary Technical Data
Rev. PrA | Page 26 of 27
NOTES
Preliminary Technical Data
ADN2815
Rev. PrA | Page 27 of 27
NOTES
Purchase of licensed I
2
C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I
2
C
Patent Rights to use these components in an I
2
C system, provided that the system conforms to the I
2
C Standard Specification as defined by Philips.
2004 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
PR04952-0-8/04(PrA)