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Периферийное сканирование (JTAG) Логика (Boundary Scan (JTAG) Logic)

Производителей: 2, компонентов:: 63 (0.01 сек.)

Hamamatsu Corporation
Hamamatsu Corporation
www.hamamatsu.com
  1. N7220 - EB-CCD TV SCAN RATE TYPE :, SLOW SCAN TYPE
    338.24Кб • 4 стр.
  2. N7640 - EB-CCD TV SCAN RATE TYPE :, SLOW SCAN TYPE
    338.24Кб • 4 стр.

Texas Instruments
Texas Instruments
www.ti.com
  1. SN54LVT8986 - 3.3-v Linking Addressable Scan Ports Multidrop-addressable Ieee Std 1149.1 (jtag) Tap Transceivers
    875.22Кб • 51 стр. • RoHS • Pb-Free
  2. SN74LVTH182512 - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    559.05Кб • 36 стр.
  3. SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    559.05Кб • 36 стр.
  4. 5962-9172501M3A - SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
    469.67Кб • 26 стр.
  5. SN54BCT8373A - SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
    469.67Кб • 26 стр.
  6. SN74BCT8373A - SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
    469.67Кб • 26 стр.
  7. 5962-9172601M3A - SCAN TEST DEVICES WITH OCTAL BUFFERS
    468.16Кб • 26 стр.
  8. SN54BCT8244A - SCAN TEST DEVICES WITH OCTAL BUFFERS
    468.16Кб • 26 стр.
  9. SN74BCT8244A - SCAN TEST DEVICES WITH OCTAL BUFFERS
    468.16Кб • 26 стр.
  10. SN54BCT8374A - SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
    469.98Кб • 26 стр.
  11. SN74BCT8374A - SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
    469.98Кб • 26 стр.
  12. 5962-9172801Q3A - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
    484.32Кб • 27 стр.
  13. SN74BCT8245A - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
    484.32Кб • 27 стр.
  14. 5962-9174601Q3A - SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
    468.96Кб • 26 стр.
  15. SN54BCT8240A - SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
    468.96Кб • 26 стр.
  16. SN74BCT8240A - SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
    468.96Кб • 26 стр.
  17. 5962-9318601M3A - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
    362.56Кб • 25 стр.
  18. SN74ABT8245 - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
    362.56Кб • 25 стр.
  19. 5962-9322801MXA - TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES
    303.59Кб • 15 стр.
  20. SN74ACT8990 - TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES
    303.59Кб • 15 стр.
  21. 5962-9323901Q3A - SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS
    483.87Кб • 28 стр.
  22. SN74ACT8997 - SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS
    483.87Кб • 28 стр.
  23. SN74LVTH182502A - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    610.39Кб • 38 стр.
  24. SN74LVTH18502A - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    610.39Кб • 38 стр.
  25. SN74ABT18504 - SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
    450.47Кб • 30 стр.
  26. SN74ABT18640 - SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS
    464.02Кб • 30 стр.
  27. SN74ABT18652 - SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS and REGISTERS
    171.92Кб • 11 стр.
  28. SN74ABT8543 - SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
    357.8Кб • 25 стр.
  29. SN74ABT8646 - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS and REGISTERS
    388.58Кб • 27 стр.
  30. SN74ABT8652 - SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS and REGISTERS
    367.63Кб • 25 стр.
  31. SN74ABT8952 - SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
    366.48Кб • 24 стр.
  32. SN54ABT8996 - 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
    565.31Кб • 40 стр.
  33. SN74ABT8996 - 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
    565.31Кб • 40 стр.
  34. SN74ABTH182502A - SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    549.51Кб • 37 стр.
  35. SN74ABTH18502A - SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
    549.51Кб • 37 стр.
  36. SN74ABTH182504A - SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
    547.92Кб • 35 стр.
  37. SN74ABTH18504A - SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
    547.92Кб • 35 стр.
  38. SN74ABTH182646A - SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS and REGISTERS
    559.56Кб • 37 стр.
  39. SN74ABTH18646A - SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS and REGISTERS
    559.56Кб • 37 стр.
  40. SN74ABTH182652A - SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS and REGISTERS
    575.33Кб • 37 стр.
  41. SN74ABTH18652A - SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS and REGISTERS
    575.33Кб • 37 стр.
  42. SN74LVT8980 - EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES
    495.87Кб • 34 стр.
  43. SN74LVT8980A - EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTER WITH 8-BIT GENERIC HOST INTERFACES
    585.06Кб • 35 стр.
  44. SN74LVT8996 - 3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
    713.96Кб • 44 стр.
  45. SN74LVTH182504A - 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
    545.04Кб • 35 стр.
  46. SN74LVTH18504A - 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
    545.04Кб • 35 стр.
  47. SN74LVTH182646A - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS and REGISTERS
    551.01Кб • 36 стр.
  48. SN74LVTH18646A - 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS and REGISTERS
    551.01Кб • 36 стр.
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